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Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC

hal.structure.identifierElectronics Engineering Department
dc.contributor.authorALTET, J.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
dc.contributor.authorGONZALEZ, J. L.
hal.structure.identifierElectronics Engineering Department
dc.contributor.authorGOMEZ, D.
hal.structure.identifierInstituto de Microelectrònica de Barcelona [IMB-CNM]
dc.contributor.authorPERPIÑÀ, X.
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorGRAUBY, Stéphane
hal.structure.identifierElectronics Engineering Department
dc.contributor.authorDUFIS, C.
hal.structure.identifierInstituto de Microelectrònica de Barcelona [IMB-CNM]
dc.contributor.authorVELLVEHI, M.
hal.structure.identifierElectronics Engineering Department
dc.contributor.authorMATEO, D.
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorDILHAIRE, S.
hal.structure.identifierInstituto de Microelectrònica de Barcelona [IMB-CNM]
dc.contributor.authorJORDÀ, X.
dc.date.issued2012
dc.date.conference2012-09-25
dc.description.abstractEnThis paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the characteristics of temperature sensors embedded in a integrated circuit implemented in a CMOS 65nm technology. The circuit contains a 2GHz linear power amplifier, MOS transistors behaving as heat sources and two differential temperature sensors. Temperature measurements performed with the embedded sensor are corroborated with an Infra-Red camera and a laser interferometer used as thermometer. © 2012 CMP.
dc.language.isoen
dc.subject.enTemperature sensors
dc.subject.enHeating
dc.subject.enTemperature measurement
dc.subject.enTransducers
dc.subject.enSensitivity
dc.subject.enVoltage measurement
dc.subject.enFrequency measurement
dc.title.enElectro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC
dc.typeCommunication dans un congrès
dc.subject.halPhysique [physics]
bordeaux.page61-66
bordeaux.conference.title18th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 2012
bordeaux.countryHU
bordeaux.conference.cityBudapest
bordeaux.peerReviewednon
hal.identifierhal-01555439
hal.version1
hal.invitednon
hal.proceedingsoui
hal.conference.end2012-09-27
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01555439v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2012&rft.spage=61-66&rft.epage=61-66&rft.au=ALTET,%20J.&GONZALEZ,%20J.%20L.&GOMEZ,%20D.&PERPI%C3%91%C3%80,%20X.&GRAUBY,%20St%C3%A9phane&rft.genre=unknown


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