Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC
GONZALEZ, J. L.
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
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Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
GONZALEZ, J. L.
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
< Reduce
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
Language
en
Communication dans un congrès
This item was published in
18th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 2012, 2012-09-25, Budapest. 2012p. 61-66
English Abstract
This paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the characteristics of temperature sensors embedded in a integrated circuit implemented ...Read more >
This paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the characteristics of temperature sensors embedded in a integrated circuit implemented in a CMOS 65nm technology. The circuit contains a 2GHz linear power amplifier, MOS transistors behaving as heat sources and two differential temperature sensors. Temperature measurements performed with the embedded sensor are corroborated with an Infra-Red camera and a laser interferometer used as thermometer. © 2012 CMP.Read less <
English Keywords
Temperature sensors
Heating
Temperature measurement
Transducers
Sensitivity
Voltage measurement
Frequency measurement
Origin
Hal imported