Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC
GONZALEZ, J. L.
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
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Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
GONZALEZ, J. L.
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
< Leer menos
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
Idioma
en
Communication dans un congrès
Este ítem está publicado en
18th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 2012, 2012-09-25, Budapest. 2012p. 61-66
Resumen en inglés
This paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the characteristics of temperature sensors embedded in a integrated circuit implemented ...Leer más >
This paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the characteristics of temperature sensors embedded in a integrated circuit implemented in a CMOS 65nm technology. The circuit contains a 2GHz linear power amplifier, MOS transistors behaving as heat sources and two differential temperature sensors. Temperature measurements performed with the embedded sensor are corroborated with an Infra-Red camera and a laser interferometer used as thermometer. © 2012 CMP.< Leer menos
Palabras clave en inglés
Temperature sensors
Heating
Temperature measurement
Transducers
Sensitivity
Voltage measurement
Frequency measurement
Orígen
Importado de HalCentros de investigación