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hal.structure.identifierDepartment of Electronic Engineering
dc.contributor.authorALTET, J.
hal.structure.identifierDepartment of Electronic Engineering
dc.contributor.authorRUBIO, A.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, Stefan
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorSCHAUB, Emmanuel
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCLAEYS, W.
dc.date.issued1998
dc.identifier.isbn2-913329-01-2
dc.language.isoen
dc.title.enThermal characterization of defects in an IC: Thermal testing
dc.typeOuvrage
dc.subject.halPhysique [physics]
bordeaux.page216-220
hal.identifierhal-01840916
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01840916v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=1998&rft.spage=216-220&rft.epage=216-220&rft.au=ALTET,%20J.&RUBIO,%20A.&DILHAIRE,%20Stefan&SCHAUB,%20Emmanuel&CLAEYS,%20W.&rft.isbn=2-913329-01-2&rft.genre=unknown


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