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Thermal characterization of defects in an IC: Thermal testing
hal.structure.identifier | Department of Electronic Engineering | |
dc.contributor.author | ALTET, J. | |
hal.structure.identifier | Department of Electronic Engineering | |
dc.contributor.author | RUBIO, A. | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | DILHAIRE, Stefan | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | SCHAUB, Emmanuel | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | CLAEYS, W. | |
dc.date.issued | 1998 | |
dc.identifier.isbn | 2-913329-01-2 | |
dc.language.iso | en | |
dc.title.en | Thermal characterization of defects in an IC: Thermal testing | |
dc.type | Ouvrage | |
dc.subject.hal | Physique [physics] | |
bordeaux.page | 216-220 | |
hal.identifier | hal-01840916 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-01840916v1 | |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=1998&rft.spage=216-220&rft.epage=216-220&rft.au=ALTET,%20J.&RUBIO,%20A.&DILHAIRE,%20Stefan&SCHAUB,%20Emmanuel&CLAEYS,%20W.&rft.isbn=2-913329-01-2&rft.genre=unknown |
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