Influence of a rough thin layer on the steady-state potential
PERRUSSEL, Ronan
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
PERRUSSEL, Ronan
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
< Réduire
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
Langue
en
Rapport
Ce document a été publié dans
2009p. 11
Résumé en anglais
In this paper, we study the behavior of the steady-state voltage potentials in a material composed by an interior medium surrounded by a rough thin layer and embedded in an ambient bounded medium. The roughness of the layer ...Lire la suite >
In this paper, we study the behavior of the steady-state voltage potentials in a material composed by an interior medium surrounded by a rough thin layer and embedded in an ambient bounded medium. The roughness of the layer is supposed to be $\eps$--periodic, $\eps$ being the small thickness of the layer. We present and validate numerically the rigorous approximate transmissions proved by Ciuperca, Jai and Poignard. This paper extends previous works in which the layer had a constant thickness.< Réduire
Mots clés en anglais
Asymptotic analysis
Finite Element Method
Laplace equations
Origine
Importé de halUnités de recherche