Charge noise at Cooper-pair resonances

KIRTON, P. G.; HOUZET, Manuel; PISTOLESI, Fabio; ARMOUR, Andrew D.

doi:10.1103/PhysRevB.82.064519

Métadonnées

Afficher la notice complète

Licence d’utilisation du document

KIRTON, P. G.
School of Physics and Astronomy [Nottingham]

HOUZET, Manuel
Institut Nanosciences et Cryogénie [INAC]

PISTOLESI, Fabio
Laboratoire de physique et modélisation des milieux condensés [LPM2C]
Centre de physique moléculaire optique et hertzienne [CPMOH]

Langue

Article de revue

Ce document a été publié dans

Physical Review B: Condensed Matter and Materials Physics (1998-2015). 2010-08-24, vol. 82, p. 064519 (11)

American Physical Society

Résumé en anglais

We analyze the charge dynamics of a superconducting single-electron transistor (SSET) in the regime where charge transport occurs via Cooper-pair resonances. Using an approximate description of the system Hamiltonian, in terms of a series of resonant doublets, we derive a Born-Markov master equation describing the dynamics of the SSET. The average current displays sharp peaks at the Cooper-pair resonances and we find that the charge noise spectrum has a characteristic structure which consists of a series of asymmetric triplets of peaks. The strongest feature in the charge noise spectrum is the triplet of peaks centered at zero frequency which has a peak spacing equal to the level separation within the doublets and is similar to the triplet in the spectrum of a driven, damped, two-level system. We also explore the back-action that the SSET charge noise would have on an oscillator coupled to the island charge, measurement of which provides a way of probing the charge noise spectrum.< Réduire

Mots clés en anglais

superconducting single electron transistor

dissipative systems

DOI

http://dx.doi.org/10.1103/PhysRevB.82.064519

Project ANR

NanoElectroMEchanical transport and Shuttling In normal and superconducting Systems - ANR-06-JCJC-0036

Origine

Importé de hal

Unités de recherche

Laboratoire Ondes et Matière d'Aquitaine (LOMA) - UMR 5798