ALTET, Josep; MATEO, Diego; PERPINYA, Xavier; GRAUBY, Stéphane; DILHAIRE, Stefan; JORDÀ, Xavier

doi:10.1063/1.3633957

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ALTET, Josep
Electronic Engineering Department

MATEO, Diego
Electronic Engineering Department

PERPINYA, Xavier
Centre Nacional de Microelectrònica [CNM]

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Review of Scientific Instruments. 2011-09, vol. 82, p. 094902 (4)

American Institute of Physics

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This work presents an alternative characterization strategy to quantify the nonlinear behavior of temperature sensing systems. The proposed approach relies on measuring the temperature under thermal sinusoidal steady state and observing the intermodulation products that are generated within the sensing system itself due to its nonlinear temperature-output voltage characteristics. From such intermodulation products, second-order interception points can be calculated as a figure of merit of the measuring system nonlinear behavior. In this scenario, the present work first shows a theoretical analysis. Second, it reports the experimental results obtained with three thermal sensing techniques used in integrated circuits.< Réduire

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Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring

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