Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
hal.structure.identifier | Department of Materials | |
dc.contributor.author | SCHAAB, Jakob | |
hal.structure.identifier | Institut für Optik und Atomare Physik | |
hal.structure.identifier | Forschungszentrum Jülich Peter Grünberg Institute [PGI-6] | |
dc.contributor.author | KRUG, Ingo P. | |
hal.structure.identifier | Forschungszentrum Jülich Peter Grünberg Institute [PGI-6] | |
dc.contributor.author | NICKEL, F. | |
hal.structure.identifier | Forschungszentrum Jülich Peter Grünberg Institute [PGI-6] | |
dc.contributor.author | GOTTLOB, Daniel M. | |
hal.structure.identifier | Forschungszentrum Jülich Peter Grünberg Institute [PGI-6] | |
dc.contributor.author | DOĞANAY, Hatice | |
hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
dc.contributor.author | CANO, Andres | |
hal.structure.identifier | Materials Science Division [LBNL Berkeley] | |
hal.structure.identifier | 4th Physics Institute and Research Center SCoPE | |
dc.contributor.author | HENTSCHEL, Mario | |
hal.structure.identifier | Materials Science Division [LBNL Berkeley] | |
dc.contributor.author | YAN, Z. | |
hal.structure.identifier | Materials Science Division [LBNL Berkeley] | |
dc.contributor.author | BOURRET-COURCHESNE, Edith | |
hal.structure.identifier | Forschungszentrum Jülich Peter Grünberg Institute [PGI-6] | |
dc.contributor.author | SCHNEIDER, Claus Michael | |
hal.structure.identifier | Materials Science Division [LBNL Berkeley] | |
dc.contributor.author | RAMESH, Ramamoorthy | |
hal.structure.identifier | Department of Materials | |
dc.contributor.author | MEIER, Dennis | |
dc.date.created | 2014-05-09 | |
dc.date.issued | 2014 | |
dc.identifier.issn | 0003-6951 | |
dc.description.abstractEn | High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics. | |
dc.language.iso | en | |
dc.publisher | American Institute of Physics | |
dc.title.en | Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy | |
dc.type | Article de revue | |
dc.identifier.doi | 10.1063/1.4879260 | |
dc.subject.hal | Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci] | |
dc.identifier.arxiv | 1405.2053 | |
bordeaux.journal | Applied Physics Letters | |
bordeaux.page | 232904 (4 p.) | |
bordeaux.volume | 104 | |
bordeaux.issue | 23 | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-01057650 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-01057650v1 | |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Applied%20Physics%20Letters&rft.date=2014&rft.volume=104&rft.issue=23&rft.spage=232904%20(4%20p.)&rft.epage=232904%20(4%20p.)&rft.eissn=0003-6951&rft.issn=0003-6951&rft.au=SCHAAB,%20Jakob&KRUG,%20Ingo%20P.&NICKEL,%20F.&GOTTLOB,%20Daniel%20M.&DO%C4%9EANAY,%20Hatice&rft.genre=article |
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