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hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorFOUASSIER, Olivier
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorHEINTZ, Jean-Marc
hal.structure.identifierTHALES Airborne Systems [Elancourt]
dc.contributor.authorCHAZELAS, J.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorGEFFROY, Pierre-Marie
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorSILVAIN, Jean-François
dc.date.issued2006
dc.identifier.issn0021-8979
dc.description.abstractEnLead containing solder paste is now considered as an environmental threat. In order to eliminate this undesirable environmental impact associated to their production, a family of lead-free solder joint, Sn-3.8Ag-0.7Cu, is proposed. Microstructural and mechanical data of this solder joint have been acquired and compared with the most common used SnPb solder paste. The evolution of the microstructure as well as the failure mode and the mechanical properties of SnAgCu solder joint are discussed as a function of strain rate, annealing treatments, and testing temperature. Tensile tests have been performed, at temperatures ranging from –50 to +150 °C, on bulk samples. Changes of the mechanical properties of bulk tested samples are actually correlated with microstructural changes, as shown by transmission electronic microscopy investigations.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.subject.enSnAgCu alloys
dc.subject.enMechanical properties
dc.subject.enHeat and thermomechanical treatments
dc.subject.enDeformation
dc.subject.enplasticity
dc.subject.enand creep
dc.title.enMicrostructural evolution and mechanical properties of SnAgCu alloys
dc.typeArticle de revue
dc.identifier.doi10.1063/1.2244478
dc.subject.halChimie/Matériaux
dc.subject.halPhysique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
bordeaux.journalJournal of Applied Physics
bordeaux.page043519
bordeaux.volume100
bordeaux.issue4
bordeaux.peerReviewedoui
hal.identifierhal-00111081
hal.version1
hal.popularnon
hal.audienceNon spécifiée
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00111081v1
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