MAUVY, Fabrice; LENORMAND, P.; LALANNE, Cécile; ANSART, Florence; BASSAT, Jean-Marc.; GRENIER, Jean-Claude

doi:10.1016/j.jpowsour.2007.06.061

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MAUVY, Fabrice
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

LENORMAND, P.
Centre interuniversitaire de recherche et d'ingénierie des matériaux [CIRIMAT]

LALANNE, Cécile
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

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Journal of Power Sources. 2007, vol. 171, n° 2, p. 783-788

Elsevier

Résumé en anglais

Yttria stabilized zirconia (YSZ, 8% Y2O3) thick films were coated on dense alumina substrates by a dip-coating process. The suspension was obtained by addition of a polymeric matrix in a stable suspension of commercial YSZ (Tosoh) powders dispersed in an azeotropic mixture MEK-EtOH. The suspension composition was improved by the addition of YSZ Tosoh particles encapsulated by zirconium alkoxide sol containing yttrium nitrate which are the precursors of the 8-YSZ oxide. This optimal formulation allowed preparing, via a dip-coating process, thick films which were, after thermal treatment, homogeneous, dense and crack-free. A specific method was performed to measure the electrical conductivity, i.e. to determine the ionic conductivity of the film: it uses the four-point probe technique combined with ac impedance spectroscopy. The good agreement between the classical two-electrode measurements performed on YSZ pellets and the four-electrode ones performed on YSZ films allows concluding that this method is relevant for characterizing the transport properties of thick films.< Réduire

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Four-point probe conductivity measurements

Sol-gel processes

Thick films

YSZ ionic conductivity

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Electrochemical characterization of YSZ thick films deposited by dip-coating process

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