MANCERIU, Laura Maria; COLSON, Pierre; MAHO, Anthony; EPPE, Gauthier; NGUYEN, Ngoc Duy; LABRUGÈRE, Christine; ROUGIER, Aline; CLOOTS, Rudi; HENRIST, Catherine

doi:10.1088/1361-6463/aa6e71

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MANCERIU, Laura Maria
GREENMAT-LCIS

COLSON, Pierre
GREENMAT-LCIS

MAHO, Anthony
GREENMAT-LCIS
Fonds de la Recherche Scientifique [FNRS]

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Journal of Physics D: Applied Physics. 2017-06-07, vol. 50, n° 22, p. 225501 (12 p.)

IOP Publishing

Résumé en anglais

In this study, we propose a straightforward method for x determination in sub-stoichiometric nickel oxide (Ni1−x O) films prepared by ultrasonic spray pyrolysis on fluor-tin oxide (FTO) substrates by varying the post-deposition thermal treatment. The Ni3+ concentration, the flat band potential (Φfb) and the open circuit potential (V oc) were determined by electrochemical impedance analysis in aqueous media and correlated to the transmission of Ni1−x O films. An x-ray photoelectron spectroscopy study was also performed to quantify the amount of Ni3+ in the films and compare it with the one determined by electrochemical analysis. The electrochromic behavior of the Ni1−x O films in non-aqueous electrolyte was investigated as well.With increasing Ni3+ concentration the films became more brownish and more conductive, both V oc and Φfb values increased. Calibration curves of transmission at 550 nm or open circuit potential versus carrier concentration were plotted and allowed the prediction of x in an unknown Ni1−x O sample. The Ni1−x O films characterized by the highest Ni3+ concentration have a darker colored state but lower transmission modulation, due to their reduced specific surface and increased crystallinity.< Réduire

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nickel oxide

thin films

stoichiometry evaluation

impedance spectroscopy

optical properties

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Straightforward prediction of the Ni1-xO layers stoichiometry by using optical and electrochemical measurements

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