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Straightforward prediction of the Ni1-xO layers stoichiometry by using optical and electrochemical measurements

hal.structure.identifierGREENMAT-LCIS
dc.contributor.authorMANCERIU, Laura Maria
hal.structure.identifierGREENMAT-LCIS
dc.contributor.authorCOLSON, Pierre
hal.structure.identifierGREENMAT-LCIS
hal.structure.identifierFonds de la Recherche Scientifique [FNRS]
dc.contributor.authorMAHO, Anthony
hal.structure.identifierChemistry Department
dc.contributor.authorEPPE, Gauthier
hal.structure.identifierPhysics Department [UR CESAM SPIN]
dc.contributor.authorNGUYEN, Ngoc Duy
hal.structure.identifierPlateforme Aquitaine de Caractérisation des Matériaux [PLACAMAT]
dc.contributor.authorLABRUGÈRE, Christine
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorROUGIER, Aline
hal.structure.identifierGREENMAT-LCIS
dc.contributor.authorCLOOTS, Rudi
hal.structure.identifierGREENMAT-LCIS
hal.structure.identifierCellule d'Appui à la Recherche et à l'Enseignement en Microscopie [CAREM]
dc.contributor.authorHENRIST, Catherine
dc.date.issued2017-06-07
dc.identifier.issn0022-3727
dc.description.abstractEnIn this study, we propose a straightforward method for x determination in sub-stoichiometric nickel oxide (Ni1−x O) films prepared by ultrasonic spray pyrolysis on fluor-tin oxide (FTO) substrates by varying the post-deposition thermal treatment. The Ni3+ concentration, the flat band potential (Φfb) and the open circuit potential (V oc) were determined by electrochemical impedance analysis in aqueous media and correlated to the transmission of Ni1−x O films. An x-ray photoelectron spectroscopy study was also performed to quantify the amount of Ni3+ in the films and compare it with the one determined by electrochemical analysis. The electrochromic behavior of the Ni1−x O films in non-aqueous electrolyte was investigated as well.With increasing Ni3+ concentration the films became more brownish and more conductive, both V oc and Φfb values increased. Calibration curves of transmission at 550 nm or open circuit potential versus carrier concentration were plotted and allowed the prediction of x in an unknown Ni1−x O sample. The Ni1−x O films characterized by the highest Ni3+ concentration have a darker colored state but lower transmission modulation, due to their reduced specific surface and increased crystallinity.
dc.language.isoen
dc.publisherIOP Publishing
dc.subject.ennickel oxide
dc.subject.enthin films
dc.subject.enstoichiometry evaluation
dc.subject.enimpedance spectroscopy
dc.subject.enoptical properties
dc.title.enStraightforward prediction of the Ni1-xO layers stoichiometry by using optical and electrochemical measurements
dc.typeArticle de revue
dc.identifier.doi10.1088/1361-6463/aa6e71
dc.subject.halChimie/Matériaux
bordeaux.journalJournal of Physics D: Applied Physics
bordeaux.page225501 (12 p.)
bordeaux.volume50
bordeaux.issue22
bordeaux.peerReviewedoui
hal.identifierhal-01545821
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01545821v1
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