DASGUPTA, T.; ETOURNEAU, Jean; CHEVALIER, Bernard; MATAR, Samir F.; UMARJI, A. M.

doi:10.1063/1.2917347

Métadonnées

Afficher la notice complète

Licence d’utilisation du document

DASGUPTA, T.
Materials Research Centre

ETOURNEAU, Jean
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

CHEVALIER, Bernard
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

Langue

Article de revue

Ce document a été publié dans

Journal of Applied Physics. 2008, vol. 103, n° 11, p. 113516

American Institute of Physics

Résumé en anglais

Stoichiometric CrSi2 was prepared by arc melting and compacted by uniaxial hot pressing for property measurements. The crystal structure of CrSi2 was investigated using the powder x-ray diffraction method. From the Rietveld refinement, the lattice parameters were found to be a=4.427 57 (7) and c=6.368 04 (11) Å, respectively. The thermal expansion measurement revealed an anisotropic expansion in the temperature range from room temperature 800 K with alphaa=14.58×10−6/K, alphac=7.51×10−6/K, and alphaV=12.05×10−6/K. The volumetric thermal expansion coefficient shows an anomalous decrease in the temperature range of 450–600 K. The measured electrical resistivity rho and thermoelectric power S have similar trends with a maxima around 550 K. Thermal conductivity measurements show a monotonic decrease with increasing temperature from a room temperature value of 10 W m−1 K−1. The ZT values increase with temperature and have a maximum value of 0.18 in the temperature range studied. An analysis of the electronic band structure is provided.< Réduire

Mots clés en anglais

Band structure

Chromium compounds

Crystal structure

Electrical resistivity

Hot pressing

Lattice constants

Semiconductor materials

Stoichiometry

Thermal conductivity

Thermal expansion

Thermoelectric power

X-ray diffraction

Métadonnées

Licence d’utilisation du document

Structural, thermal, and electrical properties of CrSi2

Langue

Ce document a été publié dans

Résumé en anglais

Mots clés en anglais

DOI

Origine

Unités de recherche