Structural and magnetic properties of the ternary compounds Gd<sub>2</sub>Sc<sub>3</sub>X<sub>4</sub> with X = Si and Ge
Langue
en
Article de revue
Ce document a été publié dans
Journal of Alloys and Compounds. 2011, vol. 509, n° 20, p. 5952-5957
Elsevier
Résumé en anglais
X-ray diffraction on single crystal performed on Gd<sub>2</sub>Sc<sub>3</sub>Si<sub>4</sub> reveals that this ternary silicide crystallizes as Gd<sub>2</sub>Sc<sub>3</sub>Ge<sub>4</sub> in the orthorhombic Ce<sub>2</sub> ...Lire la suite >
X-ray diffraction on single crystal performed on Gd<sub>2</sub>Sc<sub>3</sub>Si<sub>4</sub> reveals that this ternary silicide crystallizes as Gd<sub>2</sub>Sc<sub>3</sub>Ge<sub>4</sub> in the orthorhombic Ce<sub>2</sub>Sc<sub>3</sub>Si<sub>4</sub>-type with a small deficiency in gadolinium leading to the formula Gd<sub>1.88(1)</sub>Sc<sub>3</sub>Si<sub>4</sub>. The structure is formed by [Gd<sub>2</sub>Sc<sub>3</sub>Si<sub>4</sub>] slabs with Si-Si interslab covalent bonds. The investigation of the Gd<sub>2</sub>Sc<sub>3</sub>Si<sub>4</sub> and Gd<sub>2</sub>Sc<sub>3</sub>Ge<sub>4</sub> compounds by magnetization, electrical resistivity and specific heat measurements reveals their antiferromagnetic behaviors; Gd<sub>2</sub>Sc<sub>3</sub>Si<sub>5</sub> having a Néel temperature (48-52 K) higher than that observed (22-23 K) for Gd<sub>2</sub>Sc<sub>3</sub>Ge<sub>4</sub>.< Réduire
Mots clés en anglais
Ternary compounds
X-ray diffraction
Antiferromagnets
Origine
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