Structural trends and chemical bonding in Te-doped silicon clathrates
Langue
en
Article de revue
Ce document a été publié dans
Inorganic Chemistry. 2005, vol. 44, n° 7, p. 2210-2214
American Chemical Society
Résumé en anglais
The recently discovered tellurium-doped silicon clathrates, Te7+xSi20-x and Te16Si38, both low- and high-temperature forms (cubic and rhombohedral, respectively), exhibit original structures that are all derived from the ...Lire la suite >
The recently discovered tellurium-doped silicon clathrates, Te7+xSi20-x and Te16Si38, both low- and high-temperature forms (cubic and rhombohedral, respectively), exhibit original structures that are all derived from the parent type I clathrate G8Si46 (G = guest atom). The similarities and differences between the structures of these compounds and that of the parent one are analyzed and discussed on the basis of charge distribution and chemical bonding considerations. Because of the particular character of the Te atom, these compounds appear to be at the border between the clathrate and polytelluride families.< Réduire
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