JAUSSAUD, Nicolas; POUCHARD, Michel; GRAVEREAU, Pierre; PECHEV, Stanislav; GOGLIO, Graziella; CROS, Christian; SAN MIGUEL, A.; TOULEMONDE, Pierre

doi:10.1021/ic040112h

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JAUSSAUD, Nicolas
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

POUCHARD, Michel
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

GRAVEREAU, Pierre
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

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Inorganic Chemistry. 2005, vol. 44, n° 7, p. 2210-2214

American Chemical Society

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The recently discovered tellurium-doped silicon clathrates, Te7+xSi20-x and Te16Si38, both low- and high-temperature forms (cubic and rhombohedral, respectively), exhibit original structures that are all derived from the parent type I clathrate G8Si46 (G = guest atom). The similarities and differences between the structures of these compounds and that of the parent one are analyzed and discussed on the basis of charge distribution and chemical bonding considerations. Because of the particular character of the Te atom, these compounds appear to be at the border between the clathrate and polytelluride families.< Leer menos

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Structural trends and chemical bonding in Te-doped silicon clathrates

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