Selective sublimation of GaN and regrowth of AlGaN to co-integrate enhancement mode and depletion mode high electron mobility transistors
dc.rights.license | open | en_US |
dc.contributor.author | NGO, Thi Huong | |
dc.contributor.author | COMYN, Rémi | |
dc.contributor.author | CHENOT, Sébastien | |
dc.contributor.author | BRAULT, Julien | |
dc.contributor.author | NEMOZ, Maud | |
dc.contributor.author | VENNÉGUÈS, Philippe | |
dc.contributor.author | DAMILANO, Benjamin | |
dc.contributor.author | VÉZIAN, Stéphane | |
dc.contributor.author | FRAYSSINET, Eric | |
dc.contributor.author | COZETTE, Flavien | |
dc.contributor.author | DEFRANCE, Nicolas | |
dc.contributor.author | LECOURT, François | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | LABAT, Nathalie | |
dc.contributor.author | MAHER, Hassan | |
dc.contributor.author | CORDIER, Yvon | |
dc.date.accessioned | 2022-08-25T14:06:13Z | |
dc.date.available | 2022-08-25T14:06:13Z | |
dc.date.issued | 2022-09-01 | |
dc.identifier.issn | 0022-0248 | en_US |
dc.identifier.uri | oai:crossref.org:10.1016/j.jcrysgro.2022.126779 | |
dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/140583 | |
dc.description.abstractEn | In the present study, the selective sublimation of the p-GaN cap layer of Al(Ga)N/GaN HEMTs is developed to replace the commonly used dry etching with no risk of damage in the barrier layer in order to fabricate enhanced mode transistors. Thanks to this approach, enhancement-mode transistors are fabricated with a threshold voltage between 0 V and +1.5 V depending on the barrier layer aluminum molar fraction and thickness. Furthermore, we show the benefit of the combination of selective sublimation with the regrowth of AlGaN to reduce access resistance in these transistors which can be co-integrated with depletion-mode devices fabricated in the same process in areas where p-GaN has been totally evaporated. | |
dc.description.sponsorship | Co-intégration des transistors GaN à enrichissement et à déplétion pour les circuits de communication RF de la prochaine génération - ANR-16-CE24-0026 | en_US |
dc.description.sponsorship | Réseau national sur GaN - ANR-11-LABX-0014 | en_US |
dc.language.iso | EN | en_US |
dc.source | crossref | |
dc.subject.en | A1. Selective sublimation | |
dc.subject.en | A3. Local area epitaxy | |
dc.subject.en | B1. Group III-nitrides | |
dc.subject.en | B3. High electron mobility transistors | |
dc.title.en | Selective sublimation of GaN and regrowth of AlGaN to co-integrate enhancement mode and depletion mode high electron mobility transistors | |
dc.type | Article de revue | en_US |
dc.identifier.doi | 10.1016/j.jcrysgro.2022.126779 | en_US |
dc.subject.hal | Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique | en_US |
bordeaux.journal | Journal of Crystal Growth | en_US |
bordeaux.page | 126779 | en_US |
bordeaux.volume | 593 | en_US |
bordeaux.hal.laboratories | Laboratoire d’Intégration du Matériau au Système (IMS) - UMR 5218 | en_US |
bordeaux.institution | Université de Bordeaux | en_US |
bordeaux.institution | Bordeaux INP | en_US |
bordeaux.institution | CNRS | en_US |
bordeaux.peerReviewed | oui | en_US |
bordeaux.inpress | non | en_US |
bordeaux.import.source | dissemin | |
hal.export | false | |
workflow.import.source | dissemin | |
dc.rights.cc | Pas de Licence CC | en_US |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal%20of%20Crystal%20Growth&rft.date=2022-09-01&rft.volume=593&rft.spage=126779&rft.epage=126779&rft.eissn=0022-0248&rft.issn=0022-0248&rft.au=NGO,%20Thi%20Huong&COMYN,%20R%C3%A9mi&CHENOT,%20S%C3%A9bastien&BRAULT,%20Julien&NEMOZ,%20Maud&rft.genre=article |
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