Browsing Laboratoire Ondes et Matière d'Aquitaine (LOMA) - UMR 5798 by Author "QUINTARD, V."
Now showing items 1-6 of 6
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The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry
PHAN, T.; DILHAIRE, S.; QUINTARD, V. ...(Measurement Science and Technology. vol. 8, n° 3, pp. 303-316, 1997-03)Article de revue -
Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation
PHAN, T.; DILHAIRE, S.; QUINTARD, V. ...(Journal of Applied Physics. vol. 81, n° 3, pp. 1157-1168, 1997-02-01)Article de revue -
Thermoreflectance measurements of transient temperature upon integrated circuits: application to thermal conductivity identification
PHAN, T.; DILHAIRE, S.; QUINTARD, V. ...(Microelectronics Reliability. vol. 29, n° 4-5, pp. 181-190, 1998-04)Article de revue -
TESTING OF THE QUALITY OF SOLDER JOINTS THROUGH THE ANALYSIS OF THEIR THERMAL-BEHAVIOR WITH AN INTERFEROMETRIC LASER PROBE
CLAEYS, W.; QUINTARD, V.; DILHAIRE, S. ...(Quality and Reliability Engineering International. vol. 10, n° 3, pp. 237-242, 1994)Article de revue -
OPTICAL AMMETER FOR INTEGRATED-CIRCUIT CHARACTERIZATION AND FAILURE ANALYSIS
CLAEYS, W.; DILHAIRE, S.; LEWIS, D. ...(Quality and Reliability Engineering International. vol. 11, n° 4, pp. 247-251, 1995)Article de revue -
LASER PROBING OF THERMAL-BEHAVIOR OF ELECTRONIC COMPONENTS AND ITS APPLICATION IN QUALITY AND RELIABILITY TESTING
CLAEYS, W.; DILHAIRE, S.; QUINTARD, V.(Microelectronic Engineering. vol. 24, n° 1-4, pp. 411-420, 1994-03)Article de revue