Browsing Laboratoire Ondes et Matière d'Aquitaine (LOMA) - UMR 5798 by Author "QUINTARD, V."
Now showing items 1-5 of 5
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EARLY DETECTION OF AGING IN SOLDER JOINTS THROUGH LASER PROBE THERMAL-ANALYSIS OF THE PELTIER EFFECT
CLAEYS, W.; QUINTARD, V.; DILHAIRE, S. ...Communication dans un congrès -
Modelling and experimental study of heat deposition and transport in a semiconductor laser diode
LEWIS, D.; DILHAIRE, S.; PHAN, T. ...(Microelectronics Reliability. vol. 29, n° 4-5, pp. 171-179, 1998-04)Article de revue -
Laser probe measurements of quality evolution of solder joints during thermal cycling ageing tests
QUINTARD, V.; PARMENTIER, B.; PHAN, T. ...(Quality and Reliability Engineering International. vol. 12, n° 6, pp. 447-452, 1996-11)Article de revue -
Laser beam thermography of circuits in the particular case of passivated semiconductors
QUINTARD, V.; DEBOY, G.; DILHAIRE, S. ...(Microelectronic Engineering. vol. 31, n° 1-4, pp. 291-298, 1996-02)Article de revue -
Temperature measurements of metal lines under current stress by high-resolution laser probing
QUINTARD, V.; DILHAIRE, Stefan; PHAN, T. ...(IEEE Transactions on Instrumentation and Measurement. vol. 48, n° 1, pp. 69-74, 1999)Article de revue