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Bias Temperature Instability Characterization and Modeling for 0.18um CMOS Under Extreme Thermal Stress Conditions
Communication dans un congrès -
0.45-mW 2.35-3.0 GHz Multiplying DLL with Calibration Loop in 28nm CMOS FD-SOI
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Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions
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Highly Linear Large Signal Compact Voltage-to-Current Converter in 28 nm FD-SOI Technology
Communication dans un congrès -
A Tool for Automatic Radiation-Hardened SRAM Layout Generation
Communication dans un congrès -
Reliability Investigation of 0.18mum CMOS for Oilfield Applications
Communication dans un congrès -
A Low-Noise mm-Wave Injection-Locked Oscillator designed in 65nm Partially Depleted SOI CMOS Technology
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RFIC design by mathematics for next generation wireless access
Communication dans un congrès -
Benchmark of Cosimulation Methodologies for Digital Predistorsion on IC Wideband Power Amplifiers
Communication dans un congrès -
A PAE-Controlled Wideband Power Amplifier for Sub-6GHz 5G Applications in 28nm FDSOI Technology
(2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), gb, Glasgow, 2022-12-12)Communication dans un congrès avec actes