Listar Institut de Mécanique et d’Ingénierie de Bordeaux (I2M) - UMR 5295 por autor "SCHICK, Vincent"
Mostrando ítems 1-3 de 3
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Thermal characterization of the SiO2-Ge2Sb2Te5 interface from room temperature up to 400 °C
BATTAGLIA, Jean-Luc; KUSIAK, Andrzej; SCHICK, Vincent ...(British Journal of Applied Physics. vol. 107, n° 4, pp. doi:10.1063/1.3284084, 2010-02-24)Article de revue -
Temperature-dependent thermal characterization of Ge 2 Sb 2 Te 5 and related interfaces by the photothermal radiometry technique
BATTAGLIA, Jean-Luc; CAPPELLA, Andrea; VARESI, Enrico ...(Journal of Physics: Conference Series. vol. 214, pp. 012102, 2010-03-01)Article de revue -
High Temperature Thermal Conductivity of Amorphous Al 2 O 3 Thin Films Grown by Low Temperature ALD
CAPPELLA, Andrea; BATTAGLIA, Jean-Luc; SCHICK, Vincent ...(Advanced Engineering Materials. vol. 15, n° 11, pp. 1046-1050, 2013-11)Article de revue