Reliability Investigation of 0.18mum CMOS for Oilfield Applications
| dc.rights.license | open | en_US |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | TRAN, Yen | |
| dc.contributor.author | NOMURA, Toshihiro | |
| dc.contributor.author | CHERCHALI, Mohamed Salim | |
| dc.contributor.author | TASSIN, Claire | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | DEVAL, Yann | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | MANEUX, Cristell
IDREF: 135213584 | |
| dc.date.accessioned | 2024-04-08T10:08:09Z | |
| dc.date.available | 2024-04-08T10:08:09Z | |
| dc.date.issued | 2021-09-27 | |
| dc.date.conference | 2021-07-19 | |
| dc.identifier.isbn | 978-3-8007-5588-2 | en_US |
| dc.identifier.issn | 2473-2001 | en_US |
| dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/194984 | |
| dc.description.abstract | We investigated the degradation due to bias temperature instability (BTI) and hot carrier injection (HCI) for 0.18micrometer CMOS (Complementary Metal-Oxide- Semiconductor) under extreme temperature operations (150 deg C and 210 deg C). The transistors have been applied dedicated DC bias and temperature conditions to investigate each intrinsic wear-out mechanism in specific severe environment for oilfield applications. The aging tests have been monitored for up to 1,000 hours. These results are preliminarily used to develop equations reflecting aging laws to be included in commercial software tool for further investigation at logic circuit level. | |
| dc.language.iso | EN | en_US |
| dc.title.en | Reliability Investigation of 0.18mum CMOS for Oilfield Applications | |
| dc.type | Communication dans un congrès | en_US |
| dc.subject.hal | Sciences de l'ingénieur [physics] | en_US |
| bordeaux.hal.laboratories | IMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218 | en_US |
| bordeaux.institution | Université de Bordeaux | en_US |
| bordeaux.institution | Bordeaux INP | en_US |
| bordeaux.institution | CNRS | en_US |
| bordeaux.conference.title | International Conference on SMACD and 16th Conference on PRIME | en_US |
| bordeaux.title.proceeding | SMACD / PRIME 2021; International Conference on SMACD and 16th Conference on PRIME | en_US |
| bordeaux.team | CIRCUIT DESIGN - M4C | en_US |
| bordeaux.team | CIRCUIT DESIGN - CAS | en_US |
| bordeaux.conference.city | Online | en_US |
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| hal.invited | oui | en_US |
| hal.proceedings | oui | en_US |
| hal.popular | non | en_US |
| hal.audience | Internationale | en_US |
| hal.export | true | |
| dc.rights.cc | Pas de Licence CC | en_US |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2021-09-27&rft.eissn=2473-2001&rft.issn=2473-2001&rft.au=TRAN,%20Yen&NOMURA,%20Toshihiro&CHERCHALI,%20Mohamed%20Salim&TASSIN,%20Claire&DEVAL,%20Yann&rft.isbn=978-3-8007-5588-2&rft.genre=unknown |
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