Show simple item record

dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorSOBAS, Justin
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorAIRIMITOAIE, Tudor-Bogdan
IDREF: 166440396
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorMARC, Francois
IDREF: 158656628
dc.date.accessioned2023-03-07T11:29:36Z
dc.date.available2023-03-07T11:29:36Z
dc.date.issued2022-11-01
dc.identifier.issn0026-2714en_US
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/172198
dc.description.abstractEnThis article describes the development of a test bench so as to measure the ageing of 16 nm FinFETs used in a Zynq UltraScale+ FPGA from Xilinx. The Ring Oscillator (RO) drift measurement method was chosen and implemented in the setup. However, RO is a circuit sensitive not only to ageing but also to temperature and voltage. In order to mitigate the undesired sensitivity to temperature and voltage, we installed a regulation system to control the temperature and the internal voltage of the FPGA, and we characterised the RO frequency in function of the temperature and the voltage to apply post-measurement compensations. We improved the measurement circuit by using the GPS signal as a time reference. 1000 h test with (TFPGA = 100∘C) and (VFPGA = Vnom + 25%) was performed and results show clear RO frequency drifts lower than 0.1 % measured with an accuracy of 0.9 × 10−4.
dc.language.isoENen_US
dc.title.enDevelopment of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA
dc.typeArticle de revueen_US
dc.identifier.doi10.1016/j.microrel.2022.114698en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.journalMicroelectronics Reliabilityen_US
bordeaux.page114698en_US
bordeaux.volume138en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.teamCONCEPTION-M4Cen_US
bordeaux.teamAUTOMATIQUE-FFTGen_US
bordeaux.peerReviewedouien_US
bordeaux.inpressnonen_US
hal.identifierhal-04017664
hal.version1
hal.date.transferred2023-03-07T11:29:44Z
hal.exporttrue
dc.rights.ccPas de Licence CCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2022-11-01&rft.volume=138&rft.spage=114698&rft.epage=114698&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=SOBAS,%20Justin&AIRIMITOAIE,%20Tudor-Bogdan&MARC,%20Francois&rft.genre=article


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record