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hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorLOPEZ, L. D. P.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorGRAUBY, Stéphane
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, S.
dc.contributor.authorSALHI, M. A.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCLAEYS, W.
hal.structure.identifierLaboratoire d'études thermiques [LET]
dc.contributor.authorLEFEVRE, S.
hal.structure.identifierLaboratoire d'études thermiques [LET]
dc.contributor.authorVOLZ, S.
dc.date.issued2004-10
dc.identifier.issn0026-2692
dc.description.abstractEnIn this paper, we present the temperature profile measurements of a PN thermoelectric couple. The study is made in the AC regime. A couple is fed by a sinusoidal current and, using a scanning thermal microscope (SThM) and a lock-in scheme, we measure the amplitude and the phase of the first harmonic of the temperature along the surface of the couple. The influence of frequency is observed and we present a model which predicts the thermal behavior of the couple. The results of this model are in excellent agreement with the measurements.
dc.language.isoen
dc.publisherElsevier
dc.subject.enThermal properties identification
dc.subject.enAtomic force microscopy
dc.subject.enThermoelectric device
dc.title.enCharacterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope
dc.typeArticle de revue
dc.identifier.doi10.1016/j.mejo.2004.06.010
dc.subject.halPhysique [physics]
bordeaux.journalMicroelectronics Journal
bordeaux.page797-803
bordeaux.volume35
bordeaux.issue10
bordeaux.peerReviewedoui
hal.identifierhal-01550876
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01550876v1
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