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hal.structure.identifierElectronic Engineering Department
dc.contributor.authorALTET, J.
dc.contributor.authorRUBIO, A.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorSALHI, A.
dc.contributor.authorGALVEZ, J. L.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, Stefan
dc.contributor.authorSYAL, A.
hal.structure.identifierInstitut Laue-Langevin [ILL]
dc.contributor.authorIVANOV, A.
dc.date.issued2004
dc.identifier.isbn0-7695-2134-7
dc.language.isoen
dc.source.title22nd Ieee Vlsi Test Symposium, Proceedings
dc.title.enSensing temperature in CMOS circuits for thermal testing
dc.typeChapitre d'ouvrage
dc.identifier.doi10.1109/vtest.2004.1299241
dc.subject.halPhysique [physics]
bordeaux.page179-184
bordeaux.title.proceeding22nd Ieee Vlsi Test Symposium, Proceedings
hal.identifierhal-01840910
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01840910v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.btitle=22nd%20Ieee%20Vlsi%20Test%20Symposium,%20Proceedings&rft.date=2004&rft.spage=179-184&rft.epage=179-184&rft.au=ALTET,%20J.&RUBIO,%20A.&SALHI,%20A.&GALVEZ,%20J.%20L.&DILHAIRE,%20Stefan&rft.isbn=0-7695-2134-7&rft.genre=unknown


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