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hal.structure.identifierInstitut de Mathématiques de Bordeaux [IMB]
dc.contributor.authorNIKULIN, Mikhail
dc.contributor.authorN.BALAKRISHNAN, Bala
dc.contributor.authorKAHLE, Waltraud
dc.contributor.authorHUBER-CAROL, Catherine
dc.contributor.editorM.Nikulin
dc.contributor.editorN.Limnios
dc.contributor.editorN.Balakrishnan
dc.contributor.editorW.Kahle
dc.contributor.editorC.Huber
dc.date.created2009
dc.date.issued2010
dc.description.abstractEnThis volume is dedicated to William Meeker. It includes 26 papers on the topics of degradation and accelerated life tsting written by experts.
dc.language.isoen
dc.publisherSpringer/Birkhauser
dc.title.enAdvances in Degradation Modeling: Applications to Reliability, Survival Analysis and Finance, Springer/ Birkhauser: Boston, 2010, 416p .
dc.typeOuvrage
dc.identifier.doi10.1007/978-0-8176-4924-1
dc.subject.halMathématiques [math]/Statistiques [math.ST]
dc.subject.halStatistiques [stat]/Théorie [stat.TH]
bordeaux.page416
hal.identifierhal-00463052
hal.version1
hal.popularnon
hal.audienceNon spécifiée
dc.subject.itAccelerated testing
dc.subject.itDegradation model
dc.subject.itDegradation process
dc.subject.itFailure-Degradation data
dc.subject.itReliability
dc.subject.itSurvival analysis
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00463052v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2010&rft.spage=416&rft.epage=416&rft.au=NIKULIN,%20Mikhail&N.BALAKRISHNAN,%20Bala&KAHLE,%20Waltraud&HUBER-CAROL,%20Catherine&rft.genre=unknown


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