LECLERE, P.; CORNET, V.; SURIN, M.; VIVILLE, P.; AIME, J. P.; LAZZARONI, R.

doi:10.1021/bk-2005-0897.ch007

Métadonnées

Afficher la notice complète

Licence d’utilisation du document

http://creativecommons.org/licenses/by-nc/

LECLERE, P.
European Organization for Nuclear Research [CERN]

CORNET, V.
Biologie des Organismes et Ecosystèmes Aquatiques [BOREA]

SURIN, M.

Langue

Communication dans un congrès

Ce document a été publié dans

Symposium on Applications of Scanned Probe Microscopy to Polymers held at the 214th National ACS Meeting, 2003, Unknown. 2003p. 86-97

Résumé en anglais

Dynamic atomic force microscopy is known for its ability to image soft materials without inducing severe damage. The understanding of the origin of the image contrast is not obvious and constitutes an important subject of debate. Here, we propose a straightforward method, based on the analysis of approach-retract curves, which provides an unambiguous quantitative measurement of the local mechanical response and/or topographic contribution(s), depending on the studied sample. From the recorded data, we show that it is possible to determine the different contributions and, therefore, go beyond the morphological aspects. This approach is illustrated here on a thermoplastic elastomer block copolymer, used as a model system presenting phase-separated nanodomains characterized by specific mechanical properties. The extension of the technique to other polymer systems, such as polymer blends, polymer nanocomposites, and conjugated materials, is also discussed.< Réduire

Métadonnées

Licence d’utilisation du document

Dynamic atomic force microscopy analysis of polymer materials: Beyond imaging their surface morphology

Langue

Ce document a été publié dans

Résumé en anglais

DOI

Origine

Unités de recherche