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hal.structure.identifierLaboratoire matériaux et microélectronique de Provence [L2MP]
dc.contributor.authorNONY, Laurent
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorBOISGARD, Rodolphe
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorAIMÉ, Jean-Pierre
dc.date.created1999
dc.date.issued1999
dc.identifier.issn0021-9606
dc.description.abstractEnThe dynamical properties of an oscillating tip-cantilever system are now widely used in the field of scanning force microscopy. The aim of the present work is to get analytical expressions describing the nonlinear dynamical properties of the oscillator in noncontact and intermittent contact situations in the tapping mode. Three situations are investigated: the pure attractive interaction, the pure repulsive interaction, and a mixing of the two. The analytical solutions obtained allow general trends to be extracted: the noncontact and the intermittent contact show a very discriminate variation of the phase. Therefore the measurement of the phase becomes a simple way to identify whether or not the tip touches the surface during the oscillating period. It is also found that the key parameter governing the structure of the dynamical properties is the product of the quality factor by a reduced stiffness. In the attractive regime, the reduced stiffness is the ratio of an attractive effective stiffness and the cantilever one. In the repulsive regime, the reduced stiffness is the ratio between the contact stiffness and the cantilever one. The quality factor plays an important role. For large values of the quality factor; it is predicted that a pure topography can be obtained whatever the value of the contact stiffness. For a smaller quality factor, the oscillator becomes more sensitive to change of the local mechanical properties. As a direct consequence, varying the quality factor, for example with a vacuum chamber, would be a very interesting way to investigate soft materials either to access topographic information or nanomechanical properties.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.subject.enAFM
dc.subject.entapping mode
dc.subject.ennon-linear dynamics
dc.subject.enmechanical response
dc.title.enNonlinear dynamical properties of an oscillating tip-cantilever system in the tapping mode
dc.typeArticle de revue
dc.identifier.doi10.1063/1.479422
dc.subject.halPhysique [physics]/Physique [physics]/Agrégats Moléculaires et Atomiques [physics.atm-clus]
dc.identifier.arxivphysics/0510099
bordeaux.journalJournal of Chemical Physics
bordeaux.page1615-1627
bordeaux.volume111(4)
bordeaux.peerReviewedoui
hal.identifierhal-00011145
hal.version1
hal.popularnon
hal.audienceNon spécifiée
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00011145v1
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