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Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements
| hal.structure.identifier | Electronic Engineering Department | |
| dc.contributor.author | ALDRETE-VIDRIO, Eduardo | |
| hal.structure.identifier | Electronic Engineering Department | |
| dc.contributor.author | MATEO, Diego | |
| hal.structure.identifier | Electronic Engineering Department | |
| dc.contributor.author | ALTET, Josep | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | SALHI, M. Amine | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | GRAUBY, Stéphane | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, Stefan | |
| hal.structure.identifier | Analog and Mixed Signal Center [AMSC] | |
| dc.contributor.author | ONABAJO, Marvin | |
| hal.structure.identifier | Analog and Mixed Signal Center [AMSC] | |
| dc.contributor.author | SILVA-MARTINEZ, Jose | |
| dc.date.created | 2009-12-23 | |
| dc.date.issued | 2010-06-08 | |
| dc.identifier.issn | 0957-0233 | |
| dc.description.abstractEn | This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 μW and a layout area of 0.005 mm2 in a 0.25 μm CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively. | |
| dc.language.iso | en | |
| dc.publisher | IOP Publishing | |
| dc.subject.en | integrated circuits | |
| dc.subject.en | RF analog circuits | |
| dc.subject.en | low-noise amplifier | |
| dc.subject.en | CMOS differential temperature sensors | |
| dc.subject.en | Michelson interferometer | |
| dc.subject.en | homodyne method | |
| dc.subject.en | heterodyne method | |
| dc.subject.en | analog circuits characterization | |
| dc.subject.en | RF built-in test | |
| dc.title.en | Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1088/0957-0233/21/7/075104 | |
| bordeaux.journal | Measurement Science and Technology | |
| bordeaux.page | 075104 (10) | |
| bordeaux.volume | 21 | |
| bordeaux.issue | 7 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-00609286 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-00609286v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Measurement%20Science%20and%20Technology&rft.date=2010-06-08&rft.volume=21&rft.issue=7&rft.spage=075104%20(10)&rft.epage=075104%20(10)&rft.eissn=0957-0233&rft.issn=0957-0233&rft.au=ALDRETE-VIDRIO,%20Eduardo&MATEO,%20Diego&ALTET,%20Josep&SALHI,%20M.%20Amine&GRAUBY,%20St%C3%A9phane&rft.genre=article |
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