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Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

hal.structure.identifierDepartment of Materials
dc.contributor.authorSCHAAB, Jakob
hal.structure.identifierInstitut für Optik und Atomare Physik
hal.structure.identifierForschungszentrum Jülich Peter Grünberg Institute [PGI-6]
dc.contributor.authorKRUG, Ingo P.
hal.structure.identifierForschungszentrum Jülich Peter Grünberg Institute [PGI-6]
dc.contributor.authorNICKEL, F.
hal.structure.identifierForschungszentrum Jülich Peter Grünberg Institute [PGI-6]
dc.contributor.authorGOTTLOB, Daniel M.
hal.structure.identifierForschungszentrum Jülich Peter Grünberg Institute [PGI-6]
dc.contributor.authorDOĞANAY, Hatice
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorCANO, Andres
hal.structure.identifierMaterials Science Division [LBNL Berkeley]
hal.structure.identifier4th Physics Institute and Research Center SCoPE
dc.contributor.authorHENTSCHEL, Mario
hal.structure.identifierMaterials Science Division [LBNL Berkeley]
dc.contributor.authorYAN, Z.
hal.structure.identifierMaterials Science Division [LBNL Berkeley]
dc.contributor.authorBOURRET-COURCHESNE, Edith
hal.structure.identifierForschungszentrum Jülich Peter Grünberg Institute [PGI-6]
dc.contributor.authorSCHNEIDER, Claus Michael
hal.structure.identifierMaterials Science Division [LBNL Berkeley]
dc.contributor.authorRAMESH, Ramamoorthy
hal.structure.identifierDepartment of Materials
dc.contributor.authorMEIER, Dennis
dc.date.created2014-05-09
dc.date.issued2014
dc.identifier.issn0003-6951
dc.description.abstractEnHigh-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.title.enImaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
dc.typeArticle de revue
dc.identifier.doi10.1063/1.4879260
dc.subject.halPhysique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
dc.identifier.arxiv1405.2053
bordeaux.journalApplied Physics Letters
bordeaux.page232904 (4 p.)
bordeaux.volume104
bordeaux.issue23
bordeaux.peerReviewedoui
hal.identifierhal-01057650
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01057650v1
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