Dielectric properties of tetragonal tungsten bronze films deposited by RF magnetron sputtering
Langue
en
Article de revue
Ce document a été publié dans
Solid State Sciences. 2014, vol. 38, p. 112-118
Elsevier
Résumé en anglais
Tetragonal tungsten bronze (TTB) films have been synthesised on Pt(111)/TiO2/SiO2/Si substrates from Ba2LnFeNb4O15 ceramics (Ln = La, Nd, Eu) by RF magnetron sputtering. X-ray diffraction measurements evidenced the ...Lire la suite >
Tetragonal tungsten bronze (TTB) films have been synthesised on Pt(111)/TiO2/SiO2/Si substrates from Ba2LnFeNb4O15 ceramics (Ln = La, Nd, Eu) by RF magnetron sputtering. X-ray diffraction measurements evidenced the multi-oriented nature of films with some degrees of preferential orientation along (111). The dependence of the dielectric properties on temperature and frequency has been investigated. The dielectric properties of the films are similar to those of the bulk, i.e., ε ∼150 and σ ∼10−6 Ω−1 cm−1 at 1 MHz and room temperature. The films exhibit two dielectric anomalies which are attributed to Maxwell Wagner polarization mechanism and relaxor behaviour. Both anomalies are sensitive to post-annealing under oxygen atmosphere and their activation energies are similar Ea ∼0.30 eV. They are explained in terms of electrically heterogeneous contributions in the films.< Réduire
Mots clés en anglais
TTB
PVD
Semiconductor oxide
Interfaces
Schottky barrier
Ferroelectric
Project ANR
Croissance Cristalline d'Oxydes Dielectriques - ANR-09-JCJC-0079
Origine
Importé de halUnités de recherche