FOURNIER, Jessica; NEAUPORT, Jérôme; GRUA, Pierre; FARGIN, Evelyne; JUBERA, Veronique; TALAGA, David; JOUANNIGOT, Stéphane

doi:10.1364/OE.18.021557

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FOURNIER, Jessica
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

NEAUPORT, Jérôme
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]

GRUA, Pierre
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]

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Optics Express. 2010, vol. 18, n° 21, p. 21557-21566

Optical Society of America - OSA Publishing

Résumé en anglais

Using luminescence confocal microscopy under 325 nm laser excitation, we explore the populations of defects existing in or at the vicinity of macroscopic surface flaws in fused silica. We report our luminescence results on two types of surface flaws: laser damage and indentation on fused silica polished surfaces. Luminescence cartographies are made to show the spatial distribution of each kind of defect. Three bands, centered at 1.89 eV, 2.75 eV and 2.25 eV are evidenced on laser damage and indentations. The band centered at 2.25 eV was not previously reported in photo luminescence experiments on indentations and pristine silica, for excitation wavelengths of 325 nm or larger. The luminescent objects, expected to be trapped in sub-surface micro-cracks, are possibly involved in the first step of the laser damage mechanism when fused silica is enlightened at 351 nm laser in nanosecond regime.< Réduire

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Evidence of a green luminescence band related to surface flaws in high purity silica glass

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