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hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorSILVAIN, Jean-François
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorFOUASSIER, Olivier
dc.date.issued2004
dc.identifier.issn0142-2421
dc.description.abstractEnXPS analysis of electroless deposition of successive Sn-Pd and Cu films on a NiTi surface has been performed in order to explain the nucleation and growth. Chemical interaction of Sn with the NiTi surface is shown to be associated with the growth of Sn oxide and hydroxide that can be formed after the reaction of Sn atoms with TiO2 oxide...
dc.language.isoen
dc.publisherWiley-Blackwell
dc.subject.enElectroless deposition
dc.subject.enNickel titanium
dc.subject.enCopper
dc.subject.enTin
dc.subject.enPalladium
dc.subject.enOxygen
dc.subject.enCluster
dc.subject.enXPS
dc.title.enXPS investigations of Sn, Sn-Pd and Sn-Pd/Cu clusters produced by electroless deposition onto NiTi micronic particles formed by atomization
dc.typeArticle de revue
dc.identifier.doi10.1002/sia.1760
dc.subject.halChimie/Matériaux
bordeaux.journalSurface and Interface Analysis
bordeaux.page769-772
bordeaux.volume36
bordeaux.issue8
bordeaux.peerReviewedoui
hal.identifierhal-00150739
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00150739v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Surface%20and%20Interface%20Analysis&rft.date=2004&rft.volume=36&rft.issue=8&rft.spage=769-772&rft.epage=769-772&rft.eissn=0142-2421&rft.issn=0142-2421&rft.au=SILVAIN,%20Jean-Fran%C3%A7ois&FOUASSIER,%20Olivier&rft.genre=article


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