Preparation and characterization of germanium oxysulfide glassy films for optics
Langue
en
Article de revue
Ce document a été publié dans
Materials Research Bulletin. 2008, vol. 43, n° 5, p. 1179-1187
Elsevier
Résumé en anglais
Homogeneous amorphous films in the GeS2-GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the ...Lire la suite >
Homogeneous amorphous films in the GeS2-GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the S/O ratio. Raman spectroscopy indicates the presence of new modes that can be assigned to intermediate germanium oxysulfide structural units. Photo-sensitivity of the oxysulfide films has been demonstrated for irradiation near the band-gap. Diffraction gratings inscribed using 488 nm exposure displayed a limited diffraction efficiency (≤3%) that weakens with a corresponding decrease in the glass S/O ratio.< Réduire
Mots clés en anglais
Glasses
Thin films
Raman spectroscopy
Optical properties
Origine
Importé de halUnités de recherche