REDDY, M. V.; WANNEK, Christophe; PECQUENARD, Brigitte; VINATIER, Philippe; LEVASSEUR, Alain

doi:10.1016/j.materresbull.2007.06.023

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REDDY, M. V.
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

WANNEK, Christophe
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

PECQUENARD, Brigitte
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

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Materials Research Bulletin. 2008, vol. 43, n° 6, p. 1519-1527

Elsevier

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Inverse spinel type structured oxide, LiNiVO4, was synthesized by using solid-state method and the crystalline powder was characterized by Rietveld refinement and X-ray photoelectron spectroscopy. Non-stoichiometric lithium nickel vanadate thin films were prepared by physical vapour deposition technique. The amorphous films were characterized by Rutherford back-scattering spectroscopy (RBS), nuclear reaction analysis (NRA), Auger electron spectroscopy (AES), X-ray diffraction (XRD), scanning electron microscopy (SEM) and high-resolution transmission electron microscopy (HRTEM) analytical methods. Films crystal growth at various temperatures was also studied by XRD and SEM. The HRTEM analysis of sputtered film shows nanocrystalline domains of NiO and LiNiVO4 phases with characteristic lattice parameters of the host compound and the results correlate well with the XRD data. Electrochemical properties of the films were discussed.< Réduire

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Thin films

Sputtering

Electron diffraction

X-ray diffraction

Electrochemical properties

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Preparation and characterization of LiNiVO4 powder and non-stoichiometric LiNixVyOz films

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