Nitrogen flow rate as a new key parameter for the nitridation of electrolyte thin films
Langue
en
Article de revue
Ce document a été publié dans
Solid State Ionics. 2008, vol. 179, n° 21-26, p. 1223-1226
Elsevier
Résumé en anglais
This work presents an investigation of the role of the nitrogen flow rate on the composition, structure and ionic conductivity of thin films prepared by reactive radio-frequency (rf) sputtering of lithium metaborate targets. ...Lire la suite >
This work presents an investigation of the role of the nitrogen flow rate on the composition, structure and ionic conductivity of thin films prepared by reactive radio-frequency (rf) sputtering of lithium metaborate targets. It was found that sputtering at constant nitrogen pressure but with increasing nitrogen flow rate leads to thin films with significantly increased nitrogen content. The effect of nitridation on the borate network has been studied by infrared transmittance spectroscopy and revealed boron–nitrogen bonding in triangular arrangements of the glass network, followed by a parallel destruction of borate tetrahedral units. The ionic conductivity of thin films was also measured and found to increase with the nitrogen amount in the film.< Réduire
Mots clés en anglais
Nitridation
Reactive sputtering
Solid electrolyte
Borate glasses
Origine
Importé de halUnités de recherche