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hal.structure.identifierLaboratoire d'études et de recherches sur les matériaux, les procédés et les surfaces [LERMPS]
dc.contributor.authorBRIOIS, Pascal
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMAZATAUD, Cécile
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorFOURCADE, Sébastien
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMAUVY, Fabrice
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorGRENIER, Jean-Claude
hal.structure.identifierLaboratoire d'études et de recherches sur les matériaux, les procédés et les surfaces [LERMPS]
dc.contributor.authorBILLARD, Alain
dc.date.issued2011
dc.identifier.issn0013-4651
dc.description.abstractEnLa-Si<sup> </sup>metallic coatings with La/Si ratios between 1.55 and 1.66 were<sup> </sup>synthesized by Direct Current Magnetron Sputtering of lanthanum and silicon<sup> </sup>targets in pure argon atmosphere. After the deposition stage, the<sup> </sup>ceramic apatite-structure coatings were obtained by thermal oxidation in air<sup> </sup>for 2 hours at 1173 K. The structural and chemical<sup> </sup>features of these films have been assessed by X-Ray Diffraction<sup> </sup>(XRD) and Scanning Electron Microscopy (SEM) equipped with Energy Dispersive<sup> </sup>Spectroscopy (EDS). The electrical properties were determined by Complex Impedance<sup> </sup>Spectroscopy in planar configuration. The films with near apatite structure<sup> </sup>La/Si atomic ratio in range of La<sub>10</sub>Si<sub>6</sub>0<sub>27</sub> and La<sub>9.33</sub>Si<sub>6</sub>0<sub>26</sub> deposited<sup> </sup>on different substrates were initially amorphous. After thermal oxidation at<sup> </sup>1173 K in air, the coating crystallised under the expected<sup> </sup>apatite structure. SEM observation revealed that the film compactness and<sup> </sup>thickness increased after thermal oxidation. The film adhesion on SOFCs<sup> </sup>material is guaranteed if the anode support was not reduced<sup> </sup>before the deposition stage. A specific method was performed to<sup> </sup>measure the electrical conductivity, <i>i.e.</i> to determine the ionic conductivity<sup> </sup>of the film: it uses the four-point probe technique combined<sup> </sup>with ac impedance spectroscopy. The good agreement between measurements performed<sup> </sup>in this work (Ea = 0.75 eV, 973 K, <sup> </sup>= 3-4 10<sup>−3</sup> S*cm<sup>−1</sup>) and literature data allows concluding that<sup> </sup>deposited layers are of good quality and should be used<sup> </sup>as electrolyte in an Intermediate Temperature Solid Oxide Fuel Cell<sup> </sup>(IT-SOFC).
dc.language.isoen
dc.publisherElectrochemical Society
dc.subject.enSOFC
dc.subject.enApatite
dc.subject.enCoating
dc.subject.enSynthesis
dc.subject.enCharacterization
dc.title.enSynthesis and characterization of apatite structure sputter deposited coatings dedicated to intermediate temperature solid oxide fuel cells
dc.typeArticle de revue
dc.identifier.doi10.1149/2.026112jes
dc.subject.halChimie/Matériaux
bordeaux.journalJournal of The Electrochemical Society
bordeaux.pageB1479-B1484
bordeaux.volume158
bordeaux.issue12
bordeaux.peerReviewedoui
hal.identifierhal-00643607
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00643607v1
bordeaux.COinSctx_ver=Z39.88-2004&amp;rft_val_fmt=info:ofi/fmt:kev:mtx:journal&amp;rft.jtitle=Journal%20of%20The%20Electrochemical%20Society&amp;rft.date=2011&amp;rft.volume=158&amp;rft.issue=12&amp;rft.spage=B1479-B1484&amp;rft.epage=B1479-B1484&amp;rft.eissn=0013-4651&amp;rft.issn=0013-4651&amp;rft.au=BRIOIS,%20Pascal&amp;MAZATAUD,%20C%C3%A9cile&amp;FOURCADE,%20S%C3%A9bastien&amp;MAUVY,%20Fabrice&amp;GRENIER,%20Jean-Claude&amp;rft.genre=article


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