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hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDEVYNCK, Mélanie
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorTARDY, Pascal
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorWANTZ, Guillaume
hal.structure.identifierInstitut des Sciences Moléculaires [ISM]
dc.contributor.authorNICOLAS, Yohann
hal.structure.identifierInstitut des Sciences Moléculaires [ISM]
dc.contributor.authorVELLUTINI, Luc
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLABRUGÈRE, Christine
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorHIRSCH, Lionel
dc.date.issued2012
dc.identifier.issn0003-6951
dc.description.abstractEnSurface modifications of the dielectric and the metal of pentacene-based field effect transistors using self-assembled monolayer (SAM) were studied. First, a low interfacial trap density and pentacene 2D-growth were favored by the nonpolar and low surface energy of octadecyltrichlorosilane-based SAM. This treatment leaded to increased mobility up to 0.4 cm2 V−1 s−1 and no observable hysteresis on transfer curves. Second, reduced hole injection barrier and contact resistance were achieved by fluorinated thiols deposited on gold contacts resulting in an increased mobility up to 0.6 cm2 V−1 s−1. Finally, a high mobility of 2.6 cm2 V−1 s−1 was achieved by cumulative effects of both treatments.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.subject.enCharge injection
dc.subject.enContact resistance
dc.subject.enDielectric hysteresis
dc.subject.enDielectric materials
dc.subject.enGrain boundaries
dc.subject.enHole mobility
dc.subject.enMonolayers
dc.subject.enOrganic field effect transistors
dc.subject.enOrganic semiconductors
dc.subject.enSelf-assembly
dc.subject.enSurface energy
dc.title.enCumulative effects of electrode and dielectric surface modifications on pentacene-based transistors
dc.typeArticle de revue
dc.identifier.doi10.1063/1.3681791
dc.subject.halSciences de l'ingénieur [physics]/Electronique
dc.subject.halSciences de l'ingénieur [physics]/Matériaux
bordeaux.journalApplied Physics Letters
bordeaux.page053308
bordeaux.volume100
bordeaux.issue5
bordeaux.peerReviewedoui
hal.identifierhal-00670178
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00670178v1
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