Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | DESHAYES, Yannick | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | BORD, Isabelle | |
hal.structure.identifier | Centre d'Etudes Nucléaires de Bordeaux Gradignan [CENBG] | |
dc.contributor.author | BARREAU, Gérard | |
hal.structure.identifier | Centre d'Etudes Nucléaires de Bordeaux Gradignan [CENBG] | |
dc.contributor.author | AICHE, Mourad | |
hal.structure.identifier | Centre d'Etudes Nucléaires de Bordeaux Gradignan [CENBG] | |
dc.contributor.author | MORETTO, Philippe | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | BÉCHOU, Laurent | |
dc.contributor.author | ROHERIG, A.C. | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | OUSTEN, Yves | |
dc.date.issued | 2008 | |
dc.identifier.issn | 0026-2714 | |
dc.language.iso | en | |
dc.publisher | Elsevier | |
dc.title.en | Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation | |
dc.type | Article de revue | |
dc.subject.hal | Sciences de l'ingénieur [physics]/Electronique | |
bordeaux.journal | Microelectronics Reliability | |
bordeaux.page | 1354-1360 | |
bordeaux.issue | 48 | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-00326851 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-00326851v1 | |
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