SCHAUMLÖFFEL, Dirk; HUTCHINSON, R.; MALHERBE, Julien; LE COUSTUMER, Philippe; GONTIER, E.; ISAURE, M.-P.

Métadonnées

Afficher la notice complète

Licence d’utilisation du document

SCHAUMLÖFFEL, Dirk
Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]

HUTCHINSON, R.

MALHERBE, Julien
Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]

Langue

Chapitre d'ouvrage

Ce document a été publié dans

Metallomics Analytical Techniques and Speciation Methods, Metallomics Analytical Techniques and Speciation Methods. 2016p. 83-116

Wiley-VCH Verlag

Résumé en anglais

This chapter presents four complementary element-specific bioimaging techniques: laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), nano secondary ion mass spectrometry (NanoSIMS), transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM/X-EDS), and synchrotron-based X-ray fluorescence (SXRF). LA-ICP-MS is a spatially resolved analytical technique mainly measuring metallic elements in solidmaterials. LA-ICP-MS bioimaging analysis has been applied to cancer studies to investigate metal-ion distribution changes in diseased versus healthy tissues. SIMS is an analytical technique that relies on the sputtering of ions from a solid surface by focused positive or negative primary ion beams and the subsequent analysis of the produced secondary ions by a mass spectrometer under high vacuum. NanoSIMS and TEM/X-EDS are operated under high vacuum where the sample is exposed to a high-energy ion beam or electron beam. These facts demand specific sample preparation strategies for biological samples, which are similar for both techniques and can be regarded together.< Réduire

Mots clés en anglais

Synchrotron-based X-ray fluorescence

TEM/X-EDS

nano secondary ion mass spectrometry

Bioimaging techniques

Metallomics

Origine

Importé de hal

Unités de recherche

Centre d'Études Nucléaires de Bordeaux Gradignan (CENBG)