Recherche
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Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy
(Microelectronics Journal. vol. 35, n° 10, pp. 811-816, 2004-10)Article de revue -
Surface displacement imaging by interferometry with a light emitting diode
(Applied optics. vol. 41, n° 24, pp. 4996-5001, 2002-08-20)Article de revue -
Characterization of thermoelectric devices by laser induced Seebeck electromotive force (LIS-EMF) measurement
(Journal of Physics D: Applied Physics. vol. 38, n° 10, pp. 1489-1497, 2005-05-21)Article de revue -
Coherent phonons in Si/ SiGe superlattices
(Physical Review B: Condensed Matter and Materials Physics (1998-2015). vol. 75, n° 19, pp. 195309, 2007)Article de revue -
Using temperature as observable of the frequency response of RF CMOS amplifiers
Communication dans un congrès -
Dynamical behavior and cut-off frequency of Si/SiGe microcoolers
(Superlattices and Microstructures. vol. 41, n° 1, pp. 7-16, 2007)Article de revue -
Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics
(Journal of Applied Physics. vol. 101, n° 1, pp. 7, 2007)Article de revue -
Dynamic surface temperature measurements in ICs
(Proceedings of the IEEE. vol. 94, n° 8, pp. 1519-1533, 2006)Article de revue -
Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization
(Review of Scientific Instruments. vol. 80, n° 2, pp. 026101 (1-3), 2009-02-02)Article de revue