Buscar
-
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy
(Microelectronics Journal. vol. 35, n° 10, pp. 811-816, 2004-10)Article de revue -
Probing the relationship between the scales of space and time in an entangled polymer network with an oscillating nanotip
(Journal of Physics: Condensed Matter. vol. 15, n° 36, pp. 6167-6177, 2003)Article de revue -
Amplitude and phase measurements of femtosecond pulses shaped by use of spectral hole burning in free-base naphthalocyanine-doped films
(Journal of the Optical Society of America B. vol. 20, n° 7, pp. 1555-1558, 2003)Article de revue -
Monitoring of supercritical carbon dioxide phase change using ferntosecond terahertz spectroscopy
Communication dans un congrès -
Protection of temperature sensitive biomedical products using molecular alloys as phase change material
(Transfusion and Apheresis Science. vol. 28, n° 2, pp. 143-148, 2003)Article de revue -
Turbulent-drag reduction of polyelectrolyte solutions: Relation with the elongational viscosity
(EPL - Europhysics Letters. vol. 64, n° 6, pp. 823-829, 2003)Article de revue -
Nonlinear microscopy
Communication dans un congrès -
High pressure study of the surface plasmon resonance in Ag nanoparticles
Communication dans un congrès -
Determination of ZT of PN thermoelectric couples by AC electrical measurement
Communication dans un congrès -
Probing local currents in semiconductors with single molecules
(Physical Review B: Condensed Matter and Materials Physics (1998-2015). vol. 64, n° 20, pp. 13, 2001)Article de revue