Thermoreflectance temperature measurement with millimeter wave
dc.contributor.author | PRADERE, Christophe
IDREF: 095038132 | |
dc.contributor.author | CAUMES, Jean-Pascal | |
dc.contributor.author | BENKHEMIS, S. | |
hal.structure.identifier | Laboratoire Ondes et Matière d'Aquitaine [LOMA] | |
dc.contributor.author | PERNOT, Gilles | |
dc.contributor.author | PALOMO, E. | |
hal.structure.identifier | Laboratoire Ondes et Matière d'Aquitaine [LOMA] | |
dc.contributor.author | DILHAIRE, Stefan | |
dc.contributor.author | BATSALE, Jean-Christophe | |
dc.date.accessioned | 2021-05-14T09:57:40Z | |
dc.date.available | 2021-05-14T09:57:40Z | |
dc.date.created | 2014-04-08 | |
dc.date.issued | 2014-06-01 | |
dc.identifier.issn | 0034-6748 | |
dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/77883 | |
dc.description.abstractEn | GigaHertz (GHz) thermoreflectance technique is developed to measure the transient temperature of metal and semiconductor materials located behind an opaque surface. The principle is based on the synchronous detection, using a commercial THz pyrometer, of a modulated millimeter wave (at 110 GHz) reflected by the sample hidden behind a shield layer. Measurements were performed on aluminum, copper, and silicon bulks hidden by a 5 cm thick Teflon plate. We report the first measurement of the thermoreflectance coefficient which exhibits a value 100 times higher at 2.8 mm radiation than those measured at visible wavelengths for both metallic and semiconductor materials. This giant thermoreflectance coefficient κ, close to 10−3 K−1 versus 10−5 K−1 for the visible domain, is very promising for future thermoreflectance applications. | |
dc.language.iso | en | |
dc.publisher | American Institute of Physics | |
dc.rights.uri | http://creativecommons.org/licenses/by-nc/ | |
dc.title.en | Thermoreflectance temperature measurement with millimeter wave | |
dc.type | Article de revue | |
dc.identifier.doi | 10.1063/1.4884639 | |
dc.subject.hal | Physique [physics]/Physique [physics]/Optique [physics.optics] | |
bordeaux.journal | Review of Scientific Instruments | |
bordeaux.page | 064904 (1-3) | |
bordeaux.volume | 85 | |
bordeaux.hal.laboratories | Institut de Mécanique et d’Ingénierie de Bordeaux (I2M) - UMR 5295 | * |
bordeaux.issue | 6 | |
bordeaux.institution | Université de Bordeaux | |
bordeaux.institution | Bordeaux INP | |
bordeaux.institution | CNRS | |
bordeaux.institution | INRAE | |
bordeaux.institution | Arts et Métiers | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-01064000 | |
hal.version | 1 | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-01064000v1 | |
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