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Thermomechanical Characterizations of Copper at Nanoscale by Laue Microdiffraction
(Satellite European School for Young Scientists Microscopy and Materials Characterization, Satellite European School for Young Scientists Microscopy and Materials Characterization, de, Dresde, 2022-10-12)Autre communication scientifique (congrès sans actes - poster - séminaire...)Libre acceso -
THz pulse generation and single shot detection in a single ZnTe Crystal IRMMW- THz 2022
Communication dans un congrèsLibre acceso -
A Block-based LMS using the Walsh Transform for Digital Predistortion of Power Amplifiers
(IEEE Transactions on Communications. pp. 1-1, 2023-07-13)Article de revueLibre acceso -
Noise spectroscopy study of methylammonium lead tribromide single-crystal detectors: Gamma-ray spectroscopy applications
(Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. vol. 1038, pp. 166904, 2022-09)Article de revueLibre acceso -
Redox-active ions unlock substitutional doping in halide perovskites
(Materials Horizons. vol. 10, n° 8, pp. 2845-2853, 2023-07-06)Article de revueLibre acceso -
Methodology combining industry 4.0 technologies and KPI’s reliability for supply chain performance
(International Journal of Computer Integrated Manufacturing. vol. 36, n° 8, pp. 1128-1152, 2023-01-13)Article de revueLibre acceso -
An annotated image dataset of vegetable crops at an early stage of growth for proximal sensing applications
(Data in Brief. vol. 42, pp. 108035, 2022-06)Article de revueLibre acceso -
Digital Twin for Smart Cities: An Enabler for Large-Scale Enterprise Interoperability
(I-esa 2022 (11th internAtional conference), I-esa 2022 (11th internAtional conference), es, Valence, 2022-03)Communication dans un congrès avec actesLibre acceso -
Marine trematode parasites as indicators of environmental changes
(Ecological Indicators. vol. 141, pp. 109089, 2022-08-01)Article de revueLibre acceso -
A Walsh-Based Arbitrary Waveform Generator for 5G Applications in 28nm FD-SOI CMOS Technology
(IEEE Access. vol. 11, pp. 117434-117442, 2023-11-01)Article de revueLibre acceso