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A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications
(IEEE Transactions on Circuits and Systems I: Regular Papers. pp. 1-11, 2023-09-13)Article de revue -
A Walsh-Based Arbitrary Waveform Generator for 5G Applications in 28nm FD-SOI CMOS Technology
(IEEE Access. vol. 11, pp. 117434-117442, 2023-11-01)Article de revueLibre accès -
0.45-mW 2.35-3.0 GHz Multiplying DLL with Calibration Loop in 28nm CMOS FD-SOI
Communication dans un congrès -
A Tool for Automatic Radiation-Hardened SRAM Layout Generation
Communication dans un congrès