Listar IMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218 por autor "Tassin, Claire"
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Bias Temperature Instability Characterization and Modeling for 0.18um CMOS Under Extreme Thermal Stress Conditions
TRAN, Yen; NOMURA, Toshihiro; CHERCHALI, Mohamed Salim ...Communication dans un congrès -
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions
TRAN, Yen; NOMURA, Toshihiro; CHERCHALI, Mohamed Salim ...Communication dans un congrès -
Reliability Investigation of 0.18mum CMOS for Oilfield Applications
TRAN, Yen; NOMURA, Toshihiro; CHERCHALI, Mohamed Salim ...Communication dans un congrès