Comparative study of lead-free alloys submitted to thermomechanical ageing
dc.rights.license | open | en_US |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | FRIAA, Houda | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | GRACIA, Alexandrine
IDREF: 091970490 | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | FREMONT, Helene
IDREF: 127007571 | |
hal.structure.identifier | IRT Saint Exupéry - Institut de Recherche Technologique | |
dc.contributor.author | ROCHERON, Laure | |
hal.structure.identifier | IRT Saint Exupéry - Institut de Recherche Technologique | |
dc.contributor.author | RIVA, Raphael | |
dc.contributor.editor | IEEE | |
dc.date.accessioned | 2025-06-06T08:54:28Z | |
dc.date.available | 2025-06-06T08:54:28Z | |
dc.date.issued | 2024 | |
dc.date.conference | 2024-04-07 | |
dc.identifier.isbn | 979-8-3503-9364-4 | en_US |
dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/206836 | |
dc.description.abstractEn | Following the European RoHS directive’s restriction of certain dangerous substances, including lead in a range of electronic and electrical equipment, the SnPb eutectic, which was the most commonly used solder alloy in electronic assemblies, is replaced by SnAgCu (SAC) alloys and improved solder alloys (SAC+), by introducing small quantities of dopants such as Bi or Sb. In this study, based on accelerated experimental tests and finite element analysis, the fatigue behaviour of two different sizes chip resistors with two different types of solders joints (SAC305 and SAC+: Innolot) subjected to cyclic temperature variations, is studied. From experimental tests, the most vulnerable region in different solder joints where the crack may originate and propagate have been identified and their path length quantified as a percentage. The creep properties of both studied solder joints have been described using the Anand model. Creep strain, Von Mises stress and stress-strain hysteresis loop at the critical region were extracted from simulations for the solder alloys. Numerical results showed a good concordance with cross-sectional observation by optical microscopy. A significant difference was observed between the two different solder alloys: doped SAC has better performance against thermal cycling than the SAC305. A comparison of the size of the chip resistor showed that the smaller component seems to be more performant than the larger one (R1210). | |
dc.language.iso | EN | en_US |
dc.subject.en | Lead-free soldering | |
dc.subject.en | Numerical simulations | |
dc.subject.en | Fatigue | |
dc.subject.en | Thermal ageing | |
dc.subject.en | Mechanical behaviour | |
dc.title.en | Comparative study of lead-free alloys submitted to thermomechanical ageing | |
dc.type | Communication dans un congrès | en_US |
dc.identifier.doi | 10.1109/EuroSimE60745.2024.10491424 | en_US |
dc.subject.hal | Sciences de l'ingénieur [physics] | en_US |
bordeaux.hal.laboratories | IMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218 | en_US |
bordeaux.institution | Université de Bordeaux | en_US |
bordeaux.institution | Bordeaux INP | en_US |
bordeaux.institution | CNRS | en_US |
bordeaux.conference.title | International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) 2024 | en_US |
bordeaux.country | it | en_US |
bordeaux.title.proceeding | 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024 | en_US |
bordeaux.team | RELIABILITY | en_US |
bordeaux.conference.city | Catania | en_US |
hal.identifier | hal-05100833 | |
hal.version | 1 | |
hal.date.transferred | 2025-06-06T08:54:31Z | |
hal.proceedings | oui | en_US |
hal.conference.end | 2024-04-10 | |
hal.popular | non | en_US |
hal.audience | Internationale | en_US |
hal.export | true | |
workflow.import.source | crossref | |
dc.rights.cc | Pas de Licence CC | en_US |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2024&rft.au=FRIAA,%20Houda&GRACIA,%20Alexandrine&FREMONT,%20Helene&ROCHERON,%20Laure&RIVA,%20Raphael&rft.isbn=979-8-3503-9364-4&rft.genre=unknown |
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