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dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorFRIAA, Houda
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorGRACIA, Alexandrine
IDREF: 091970490
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorFREMONT, Helene
IDREF: 127007571
hal.structure.identifierIRT Saint Exupéry - Institut de Recherche Technologique
dc.contributor.authorROCHERON, Laure
hal.structure.identifierIRT Saint Exupéry - Institut de Recherche Technologique
dc.contributor.authorRIVA, Raphael
dc.contributor.editorIEEE
dc.date.accessioned2025-06-06T08:54:28Z
dc.date.available2025-06-06T08:54:28Z
dc.date.issued2024
dc.date.conference2024-04-07
dc.identifier.isbn979-8-3503-9364-4en_US
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/206836
dc.description.abstractEnFollowing the European RoHS directive’s restriction of certain dangerous substances, including lead in a range of electronic and electrical equipment, the SnPb eutectic, which was the most commonly used solder alloy in electronic assemblies, is replaced by SnAgCu (SAC) alloys and improved solder alloys (SAC+), by introducing small quantities of dopants such as Bi or Sb. In this study, based on accelerated experimental tests and finite element analysis, the fatigue behaviour of two different sizes chip resistors with two different types of solders joints (SAC305 and SAC+: Innolot) subjected to cyclic temperature variations, is studied. From experimental tests, the most vulnerable region in different solder joints where the crack may originate and propagate have been identified and their path length quantified as a percentage. The creep properties of both studied solder joints have been described using the Anand model. Creep strain, Von Mises stress and stress-strain hysteresis loop at the critical region were extracted from simulations for the solder alloys. Numerical results showed a good concordance with cross-sectional observation by optical microscopy. A significant difference was observed between the two different solder alloys: doped SAC has better performance against thermal cycling than the SAC305. A comparison of the size of the chip resistor showed that the smaller component seems to be more performant than the larger one (R1210).
dc.language.isoENen_US
dc.subject.enLead-free soldering
dc.subject.enNumerical simulations
dc.subject.enFatigue
dc.subject.enThermal ageing
dc.subject.enMechanical behaviour
dc.title.enComparative study of lead-free alloys submitted to thermomechanical ageing
dc.typeCommunication dans un congrèsen_US
dc.identifier.doi10.1109/EuroSimE60745.2024.10491424en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.titleInternational Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) 2024en_US
bordeaux.countryiten_US
bordeaux.title.proceeding25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024en_US
bordeaux.teamRELIABILITYen_US
bordeaux.conference.cityCataniaen_US
hal.identifierhal-05100833
hal.version1
hal.date.transferred2025-06-06T08:54:31Z
hal.proceedingsouien_US
hal.conference.end2024-04-10
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exporttrue
workflow.import.sourcecrossref
dc.rights.ccPas de Licence CCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2024&rft.au=FRIAA,%20Houda&GRACIA,%20Alexandrine&FREMONT,%20Helene&ROCHERON,%20Laure&RIVA,%20Raphael&rft.isbn=979-8-3503-9364-4&rft.genre=unknown


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