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dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDUBOIS, Stanislas
dc.contributor.authorLELONG, Bruno
dc.contributor.authorHODE, Jean-Michel
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorFERRE, Guillaume
IDREF: 120393131
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDALLET, Dominique
IDREF: 122168887
dc.date.accessioned2024-05-14T07:38:46Z
dc.date.available2024-05-14T07:38:46Z
dc.date.issued2022-09
dc.date.conference2022-09-12
dc.identifier.isbn978-1-71386-283-3en_US
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/199811
dc.description.abstractEnThe linearization of active electronic components such as the PA or the ADC, is a vast subject. Many issues come into play, including behavioral modeling with the selection of a relevant model in terms of accuracy and complexity, the identification of this model, and the correction of defects by compensation. In this article, we propose a baseband model of non-linearity defects observed at the digitization output and after IQ demodulation, with a focus on order 3 intermodulation. We then introduce a refinement of this model by adding a dependence on the variation of the instantaneous frequency of the signal. We describe a method suitable for calibration of the model, by identification on a two-tone signal. We finally present a measurement bench adapted to the calibration of the coefficients of the model, followed by some results of linearization. © 2022 25th IMEKO TC-4 International Symposium on Measurement of Electrical Quantities, IMEKO TC-4 2022 and 23rd International Workshop on ADC and DAC Modelling and Testing, IWADC 2022. All rights reserved.
dc.language.isoENen_US
dc.title.enIdentification and Mitigation of Intermodulation Products Using a Baseband Polynomial Distortion Model with Instantaneous Frequency Dependence
dc.typeCommunication dans un congrèsen_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.page73-78en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.title25th IMEKO TC4 International Symposiumen_US
bordeaux.countryiten_US
bordeaux.teamCIRCUIT DESIGN-CSNen_US
bordeaux.teamSIGNAL AND IMAGE PROCESSING-SPECTRALen_US
bordeaux.conference.cityBresciaen_US
hal.identifierhal-04574285
hal.version1
hal.date.transferred2024-05-14T07:38:48Z
hal.invitedouien_US
hal.proceedingsouien_US
hal.conference.end2022-09-14
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exporttrue
dc.rights.ccPas de Licence CCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2022-09&rft.spage=73-78&rft.epage=73-78&rft.au=DUBOIS,%20Stanislas&LELONG,%20Bruno&HODE,%20Jean-Michel&FERRE,%20Guillaume&DALLET,%20Dominique&rft.isbn=978-1-71386-283-3&rft.genre=unknown


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