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hal.structure.identifierSanté et agroécologie du vignoble [UMR SAVE]
dc.contributor.authorBURIE, Jean-Baptiste
hal.structure.identifierLABORATOIRE DE RHEOLOGIE DU BOIS DE BORDEAUX [LRBB]
dc.contributor.authorLANGLAIS, Michel
hal.structure.identifierSanté et agroécologie du vignoble [UMR SAVE]
dc.contributor.authorCALONNEC, Agnes
hal.structure.identifierUniversité de Picardie Jules Verne [UPJV]
dc.contributor.authorMAMMERI, Y.
dc.date.accessioned2024-04-08T12:29:57Z
dc.date.available2024-04-08T12:29:57Z
dc.date.issued2012
dc.date.conference2012-10-31
dc.identifier.isbn978-1-4673-0070-4
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/196967
dc.description.abstractEnThe spread of a pathogen within an anthropized crop plot depends on many factors acting at contrasted spatio-temporal scales. This is of paramount importance for vine and powdery mildew, one of its airborne pathogen. We aimed at developing a coupled PDEs-ODEs model for plant-pathogen interactions at the plot scale level in order to assess the effects of various host heterogeneities on the epidemic spread.
dc.language.isoen
dc.publisherIEEE
dc.publisher.locationNew York (united states)
dc.subjectPDE-ODE
dc.subjectsimulations
dc.subject.encomponent
dc.subject.enplant-pathogen
dc.subject.enheterogeneous plot
dc.title.enModeling the spread of a pathogen over a spatially heterogeneous growing crop
dc.typeCommunication dans un congrès
dc.subject.halSciences du Vivant [q-bio]/Ingénierie des aliments
dc.subject.halSciences de l'ingénieur [physics]/Génie des procédés
dc.subject.halSciences du Vivant [q-bio]
bordeaux.hal.laboratoriesSanté et Agro-Ecologie du Vignoble (SAVE) - UMR 1065*
bordeaux.institutionBordeaux Sciences Agro
bordeaux.institutionINRAE
bordeaux.conference.title4. International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications
bordeaux.countryCN
bordeaux.conference.cityShanghai
bordeaux.peerReviewedoui
hal.identifierhal-02747600
hal.version1
hal.invitednon
hal.conference.organizerInstitute of Electrical and Electronics Engineers (IEEE). USA.
hal.conference.end2012-11-03
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-02747600v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2012&rft.au=BURIE,%20Jean-Baptiste&LANGLAIS,%20Michel&CALONNEC,%20Agnes&MAMMERI,%20Y.&rft.isbn=978-1-4673-0070-4&rft.genre=unknown


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